Semiconductor Optical Coupler Tester
Accurate, flexible, fast testing of photonic integrated circuits (PIC) with traceable results. Complete PIC testing platform for precise and repeatable optical alignment and electrical probing. We design and manufacture advanced test instruments and systems for high-speed optical modules, laser diodes, Silicon Photonics wafers, and Co-Packaged Optics devices. Flexible Silicon Photonics Probing Solution for Vertical and Edge Coupling FormFactor's Autonomous Silicon Photonics Measurement Assistant sets the industry-standard in wafer and die-level silicon photonics probing. Preparation, automated execution (navigation, alignment, instrument control) and data management. There are many new processes and capabilities which require to perform variety of non-conventional on-wafer measurements, such as pure parametric optical: Insertion Loss (IL), polarization dependent loss (PDL) measurements, Optical/Electrical S-Parameters, E-E, E-O, O-E, O-O, optical eye, jitter.
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